Aehr Test Systems CEO to Present at the EU Power Semiconductor Executive Summit in Munich, Germany on September 19, 2022
September 14 2022 - 7:30AM
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of
semiconductor production test and reliability qualification
equipment, today announced that President and CEO Gayn
Erickson will be a speaker at the EU Power Semiconductor Executive
Summit (EU PSES) taking place September 19-20, 2022 at the Hilton
Munich Park in Munich, Germany. Mr. Erickson will be giving a
presentation on September 19th at 4:30pm local Munich time.
The presentation is titled, “Evaluating Stabilization of Silicon
Carbide MOSFET Gate Threshold Voltage at Wafer Level,” and will
discuss how the transition from discrete Silicon Carbide (SiC)
components to multiple SiC die modules or integrated power modules
has driven the requirement for known good die (KGD), where the gate
threshold voltage stability is critical to the module reliability
driven by the prerequisite to have matching and stable gate voltage
threshold die-to-die. This presentation will provide examples of
gate threshold instabilities and failures along with the
technologies and capabilities available that enable gate threshold
stability and reliability at wafer level.
At the conclusion of the presentation, a copy will be made
available on the investor relations page of Aehr’s website at
www.aehr.com. There is no webcast.
The EU Power Semiconductor Executive Summit brings together
power semiconductor professionals from around the globe, providing
opportunities to learn from and engage with industry leaders. The
agenda will feature two days full of events, including keynotes,
business meetings, networking roundtables and a gala dinner. Power
electronics is a technology driver for the future. Industries and
countries around the world are pushing to increase energy
efficiency and reduce CO2 emissions. The world is moving towards
carbon neutrality, and power semiconductors will play a crucial
role in this realization. The increased demand for electric
vehicles, consumer electronics, 5G & IoT, and automation of
industrial equipment is fueling power semiconductor efficiency,
performance, size, cost, and sustainability. You may register to
the event here.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in semiconductor devices in wafer level,
singulated die, and package part form, and has installed over 2,500
systems worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, incremental capacity needs, and new
opportunities for Aehr Test products in package, wafer level, and
singulated die/module level test. Aehr Test has developed and
introduced several innovative products, including the
ABTS™ and FOX-P™ families of test and burn-in systems and
FOX WaferPak™ Aligner, FOX WaferPak Contactor, FOX DiePak®
Carrier and FOX DiePak Loader. The ABTS system is used in
production and qualification testing of packaged parts for both
lower power and higher power logic devices as well as all common
types of memory devices. The FOX-XP and FOX-NP systems are full
wafer contact and singulated die/module test and burn-in systems
used for burn-in and functional test of complex devices, such as
leading-edge silicon carbide-based power semiconductors, memories,
digital signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
Contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Contacts:
Aehr Test Systems |
MKR Investor Relations Inc. |
Vernon Rogers |
Todd Kehrli or Jim Byers |
EVP of Sales & Marketing |
Analyst/Investor Contact |
(510) 623-9400 x215 |
(213) 277-5550 |
vrogers@aehr.com |
aehr@mkr-group.com |
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