NuTool Announces Evaluation of Nanometrics Laser Profiler Technology for Copper Step Height Measurement Partnership with Nanometrics to Evaluate Integrated Metrology Solution for Post-Plating Copper Step Height/Profile Measurement MILPITAS, Calif., Feb. 17 /PRNewswire/ -- NuTool, Inc., a privately funded, closely held semiconductor equipment company, today announced a partnership with Nanometrics, Inc., to develop a method for monitoring the planarity of plated copper films. Control of the withindie range and the planarity of copper films deposited by various electrochemical methods are becoming critical parameters for the successful integration of