Verigy Shortens SoC Manufacturers' Time to Yield with Inovys Silicon Debug Solution for the V93000 Platform
June 10 2008 - 7:30AM
Business Wire
Verigy (NASDAQ: VRGY), a premier semiconductor test company, has
introduced the Inovys� Silicon Debug Solution to address the
growing need for more efficient debug to accelerate time to volume
production of new system-on-chip (SoC) devices. Verigy�s new
solution combines the revolutionary Inovys FaultInsyte software
with the scalable and flexible Verigy V93000 SoC test system. The
result is an integrated solution that reduces the time required for
fault detection and diagnosis by efficiently mapping electrical
failures to physical defects on complex SoC devices. This
significantly shortens time to debug, ramp and volume production
for manufacturers using processes at 90 nanometers and below. As
complex SoCs are increasingly at the core of consumer electronic
devices, product lifetimes are shrinking, leading to pressure to
reduce time-to-market and leaving scant time for debug and
characterization activities. At the same time, designs at and below
the 90 nm process node are highly sensitive to fabrication
equipment variation, leading to new defect mechanisms and fault
models. In addition, at this scale, process and design interactions
introduce new, complex failures and defects. �Accelerating the
detection and diagnosis of design-induced failures is essential to
achieving time-to-market for complex SoC devices. At the latest
process nodes, the advantage of a few weeks to market can mean
millions of dollars to the designer,� said Hans-Juergen Wagner,
vice president and general manager of Verigy�s Semiconductor Test
Solutions. �The Inovys Silicon Debug Solution, integrated with the
measurement capabilities of the V93000, provides a unique tool.
Manufacturers can now find previously elusive faults while the
complex SoC devices are still on the tester and without invoking
expensive and time-consuming systems and processes.� The Inovys
Silicon Debug Solution seamlessly combines two proven,
best-in-class solutions. The V93000 SoC test system delivers fast
and accurate data collection through its large fail capture memory,
measurement repeatability and per-pin architecture. The Inovys
FaultInsyte technology provides revolutionary visualization and
diagnostic tools with unique views into the �structural DNA� of the
semiconductor device. The Silicon Debug solution can easily be
added to existing V93000 Pin Scale systems. With the V93000�s
large, global installed base, yield acceleration becomes widely
accessible. Verigy is currently working with early-adoption
customers, and the solution will be widely available beginning
November 2008. More information is available at
www.verigy.com/go/debug. About Verigy Verigy designs, develops,
manufactures, sells and services advanced semiconductor test
systems and solutions for the flash memory, high-speed memory and
system-on-chip (SoC) markets. Verigy�s scalable platforms are used
by leading companies worldwide in design validation,
characterization, and high-volume manufacturing test. Advanced
analysis tools accelerate design debug and yield ramp processes for
Verigy�s customers. Information about Verigy can be found at
www.verigy.com.
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