IEEE Awards LogicVision's Saman Adham The J.J. Archambault Eastern Canada Merit Award
March 27 2008 - 8:00AM
PR Newswire (US)
SAN JOSE, Calif., March 27 /PRNewswire-FirstCall/ -- LogicVision,
Inc. (NASDAQ:LGVND), a leading provider of semiconductor test and
yield learning solutions, today announced that Saman Adham, a Sr.
Director of Engineering at LogicVision has received the J.J.
Archambault Easter Canada Merit Award for the conception, design,
& operation of the webinar program of IEEE Canada. The award
will be presented at the IEEE Canada Awards Banquet on the evening
of May 5, 2008 in Niagara Falls during the 21st annual IEEE Canada
Canadian Conference on Electrical and Computer Engineering
(CCECE08). Saman Adham has served on the IEEE Canada (Region 7)
organization for the past 14 years. He has been an active
participant at various levels and is currently the 2007- 2008
Education Activity Chair. He is an active participant in the Test
Technology Technical Council (TTTC) and served as North America
Region group vice chair in 2004. Dr. Adham established and
currently chairs the IEEE P1450.6.2 working group standard to
standardize the test views of semiconductor embedded memories.
"IEEE Canada is very pleased with the success of the web-based
seminar program that was launched in 2007 by Dr. Adham," said
Robert Hanna, IEEE Canada President (2006-2007). "Saman was
instrumental in organizing and running these webinars. In
recognition for his excellent services and dedication to IEEE
Canada and the Engineering profession, IEEE Canada is very pleased
to recognize Dr. Adham with this prestigious service award." "Saman
is a key member of LogicVision's engineering team and instrumental
in establishing our leadership in the embedded test market," said
Fadi Maamari, Vice President of Engineering at LogicVision. "It is
great to see him recognized by his peers for his commitment and
dedication to IEEE Canada's activities." About LogicVision
LogicVision (NASDAQ:LGVND) provides proprietary technologies for
embedded test and yield learning that enable more efficient
manufacturing test of complex semiconductors. LogicVision's
embedded test solutions allow integrated circuit designers to embed
test functionality into a semiconductor design that is used during
semiconductor production test and throughout the useful life of the
chip. The company's advanced Design for Test (DFT) product line,
ETCreate(TM), works together with Silicon Insight(TM) and Yield
Insight(TM) applications to improve profit margins by reducing
device field returns and test costs, accelerating silicon bring-up
times and shortening both time to market and time to yield. For
more information on the company and its products, please visit the
LogicVision website at http://www.logicvision.com/. DATASOURCE:
LogicVision, Inc. CONTACT: Susan O'Connor Fraser, Tam
Communications, +1-831-439-1523, , for LogicVision, Inc. Web site:
http://www.logicvision.com/
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