Jordan Valley Announces Delivery of the JVX6200 XRR Metrology Tool to a Leading-Edge HDD (Hard Disk Drive) Manufacturer
September 22 2009 - 2:30PM
PR Newswire (US)
MIGDAL HA'EMEK, Israel, Sept. 22 /PRNewswire/ -- Jordan Valley
Semiconductors Ltd., the market leader in X-ray metrology tools is
pleased to announce the delivery of its JVX6200 XRR (X-Ray
Reflectometry) metrology tool to a leading-edge HDD (Hard Disk
Drive) vendor, used for quality control of its HDD head
manufacturing process. A key advantage of the XRR metrology is its
capability to simultaneously measure production stacks of >15
layers of mixed opaque and/or transparent nano layers films and
report the thickness, density and roughness of each individual
layer. "One of the challenges facing the leading edge HDD
manufacturers is to control the complex, ultra thin multilayer
deposition process in a timely, economic way," commented Isaac
Mazor, President and CEO of Jordan Valley Semiconductors. "Our
customer selected the JVX6200 system after extensive evaluations of
the tool capabilities and comparison to other methods, and based on
its outstanding ROI (Return On Investment), ease of use and the
robustness of the XRR technology," added Mr. Mazor. Jordan Valley's
XRR technology is fast, production worthy and non-destructive and
has proven to be an excellent replacement for extremely expensive
destructive testing. "The unique power of resolving a stack of
>15 layers without prior calibration or knowledge of materials
properties make the XRR extremely valuable and useful for early
process degradation detection and save time and money to our
customers," added Mr. Mazor. About the JVX6200 X-ray metrology tool
Jordan Valley's JVX6200 X-ray metrology tool is a multi channel,
high throughput and small footprint, fully automated metrology
tool, in use at many advanced production fabs worldwide. The
JVX6200 is used for advanced process control at the front end of
line (FEOL) and back-end of line (BEOL), WLP (Wafer level
packaging), MRAM and other new applications in fabs worldwide. The
JVX6200 X-Ray Reflectometry (XRR) is a non-contact,
non-destructive, surface-sensitive technique that delivers precise
and accurate characterization of thin films and multi-layer stacks.
The XRR technique measures layer thickness, density and roughness
by analyzing the interference patterns of X-rays reflecting off the
layers surfaces and interfaces. The JVX6200 XRR analyzes single and
multiple thin films metal and dielectric layers from 1nm to 1um
thick. Jordan Valley's advanced XRR technology allows measurements
on production wafers and offers superior throughput. About Jordan
Valley Jordan Valley Semiconductors Ltd. is a worldwide leader in
the development, manufacturing and supplying thin films metrology
tools for most advanced semiconductor manufacturing processes. We
offer a comprehensive family of solutions based on advanced X-Ray
Reflectometry (XRR), X-Ray Fluorescence (XRF) and High Resolution
X-Ray Diffractometry (HRXRD). These tools are fully automated,
production ready and ideal for both blanket and patterned wafers.
Jordan Valley's X-Ray technology enables accurate and precise
characterization of all film types - including single and
multi-layer stacks, high k and low k materials, metals and
dielectrics, amorphous, poly-crystal, and single crystal films.
Research and Development, Sales & Headquarters are based in
Migdal Ha'Emek, Israel. Primary manufacturing is based in Migdal
Ha'Emek with a secondary location in Durham, United Kingdom. Demo
lab, Sales & Customer support office is in Austin, Texas, USA.
Jordan Valley products are used in production by leading
semiconductor manufacturers worldwide. Jordan Valley's primary
shareholders are Clal Industries and Investments Ltd. (TASE:CII),
Intel Capital (NASDAQ:INTC), and Elron Electronic Industries Ltd.
(NASDAQ:ELRN). For additional information about Jordan Valley,
please visit our web site at: http://www.jvsemi.com/ DATASOURCE:
Jordan Valley Semiconductors Ltd. CONTACT: Alon Kapel,
Headquarters, +972.4 6543666, , or Ralph Kippen, SEA sales manager,
+886-933361873, , or Gil Griffin, USA Sales manager,
+1-512-461-2617, , or Brenda Ortiz, US Office , +1-512-832-8470, ,
all of Jordan Valley Semiconductors Ltd. Web Site:
http://www.jvsemi.com/
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