Aehr Test Systems to Participate in 10th Annual CEO Investor Summit 2018 in San Francisco July 11
July 09 2018 - 7:30AM
Aehr Test Systems (Nasdaq:AEHR), a worldwide supplier of
semiconductor test and burn-in equipment, today announced that Gayn
Erickson, president and CEO, and Ken Spink, CFO, will participate
in the 10th Annual CEO Investor Summit taking place Wednesday, July
11, 2018 in San Francisco, California.
“We look forward to discussing how our advanced test and burn-in
systems are helping companies that supply devices into the
automotive sensor, mobile communications, IC, and Internet of
Things markets meet the higher quality and reliability needs of
these markets,” said Mr. Erickson. “Our systems enable the test and
burn-in of packaged parts, modules, wafers and even systems,
supporting the rapidly changing advanced packaging used by our
customers. Aehr Test provides complete production solutions across
the product manufacturing flow to improve yield and
reliability.”
About The 10th Annual CEO SummitThe CEO Summit
is an accredited investor and publishing research analyst event
held concurrently with SEMICON West and Intersolar 2018 in San
Francisco. The event is hosted by executive management from
participating companies and will feature a “round-robin” format
consisting of small group meetings, each 30 minutes in duration.
During the event, investors and analysts will have the opportunity
to meet with up to 10 of the 21 management teams during the
30-minute group meeting sessions, as well as opportunities to meet
with additional management teams during the breakfast, a lunch
networking session, and the concluding reception. The CEO Investor
Summit is by invitation only and is open to accredited investors
and publishing research analysts.
While held concurrently with SEMICON West and Intersolar 2018,
the event is not affiliated with the show.
Contacts for 10th Annual CEO Summit 2018
Laura J.
Guerrant-Oiye |
Claire E. McAdams |
Guerrant
Associates |
Headgate Partners
LLC |
Phone: (808)
960-2642 |
Phone: (530)
265-9899 |
Email: lguerrant@guerrantir.com |
Email:
claire@headgatepartners.com |
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has an installed base of more than 2,500
systems worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, incremental capacity needs, and new
opportunities for Aehr Test products in package, wafer level, and
singulated die/module level test. Aehr Test has developed and
introduced several innovative products, including the ABTSTM and
FOX-PTM families of test and burn-in systems and FOX WaferPakTM
Aligner, FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX
DiePak Loader. The ABTS system is used in production and
qualification testing of packaged parts for both lower power and
higher power logic devices as well as all common types of memory
devices. The FOX-XP system is a full wafer contact and singulated
die/module test and burn-in system used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Contacts: |
|
|
|
Aehr Test
Systems |
MKR Group
Inc. |
Ken Spink |
Todd Kehrli or Jim
Byers |
Chief Financial
Officer |
Analyst/Investor
Contact |
(510) 623-9400
x309 |
(323) 468-2300 |
|
aehr@mkr-group.com |
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