Aehr Test Systems to Participate in Seventh Annual NYC Investor Summit
November 30 2018 - 7:30AM
Aehr Test Systems (
NASDAQ: AEHR),
a worldwide supplier of semiconductor test and burn-in equipment,
today announced that Gayn Erickson, President and CEO, is scheduled
to participate in the Seventh Annual NYC Investor Summit 2018,
taking place December 11, 2018 at the Parker New York Hotel in New
York City.
Mr. Erickson commented, “We look forward to discussing how our
advanced test and burn-in systems are helping companies that supply
devices into the automotive sensor, mobile communications, IC, and
Internet of Things markets meet the higher quality and reliability
needs of these markets, where safety, security and assurance of
user confidence are absolutely critical. As more new product
designs challenge traditional test and reliability screening
methodologies, Aehr’s wafer-level and singulated die/module
production test and burn-in capabilities offer a cost-effective
solution for high volume production.”
About the NYC SummitThe NYC Summit is hosted by
executive management from participating companies and will feature
a “round-robin” format consisting of small group meetings, each 30
minutes in duration. During the event, investors and analysts will
have the opportunity to meet with up to 10 of the 17 management
teams during the 30-minute group meeting sessions, as well as
opportunities to meet with additional management teams during the
breakfast and lunch networking sessions.
The NYC Summit is by invitation only and is open to accredited
investors and publishing research analysts. As space is limited,
please RSVP early. Hosts reserve the right to limit attendance as
necessary. Last day for registration is December 3, 2018.
RSVP Contacts for 7th Annual NYC Summit 2018To
RSVP for the NYC Summit, please contact either of the Summit’s
co-chairs:
Laura J.
Guerrant-Oiye |
|
Claire E. McAdams |
Guerrant
Associates |
|
Headgate Partners
LLC |
Phone: (808)
960-2642 |
|
Phone: (530)
265-9899 |
Email: lguerrant@guerrantir.com |
|
Email:
claire@headgatepartners.com |
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has over 2,500 systems installed worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTS™ and FOX-P™
families of test and burn-in systems and FOX WaferPak™ Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP system is a full wafer contact and singulated die/module
test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal
processors, microprocessors, microcontrollers, systems-on-a-chip,
and integrated optical devices. The WaferPak contactor contains a
unique full wafer probe card capable of testing wafers up to 300mm
that enables IC manufacturers to perform test and burn-in of full
wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable,
temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of both bare die and modules.
For more information, please visit Aehr Test Systems’ website at
www.aehr.com.
Contacts:
Aehr Test
Systems |
|
MKR Group
Inc. |
Ken Spink |
|
Todd Kehrli or Jim
Byers |
Chief Financial
Officer |
|
Analyst/Investor
Contact |
(510) 623-9400
x309 |
|
(323) 468-2300 |
|
|
aehr@mkr-group.com |
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