Aehr Test Systems Announces $1.9 Million in Follow-On Orders for Multiple ABTS™ Burn-In and Test Systems From Leading IC Ma...
May 08 2017 - 7:30AM
Aehr Test Systems (Nasdaq:AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, announced
today that it has received a follow-on order exceeding $1.9 million
for multiple ABTS test and burn-in systems from a leading
multi-national manufacturer of advanced logic integrated circuits
(ICs) for automotive, embedded processing, digital signal
processing and analog applications. The order also includes down
payments to lock in delivery dates. The ABTS systems are planned to
ship in the next few months.
“This customer continues to run at full capacity in their
burn-in and test areas, and we are pleased to receive another
follow-on order, reflecting the continued strengthening we are
seeing in our base packaged part business,” said Mark Allison, vice
president of sales at Aehr Test Systems. “Our ABTS systems, with
their individual temperature control capability for high-power
devices, are a key part of this customer’s quality and reliability
program for their expanding line of automotive products. The rapid
automotive IC growth in sensors, control information, and
entertainment is a key market driver for Aehr Test, with the number
of sensors per car estimated to reach 200 by 2020, representing a
34% CAGR.”
The ABTS family of products is based on a state-of-the-art
hardware and software platform that is designed to address not only
today’s devices, but also future devices for many years to come. It
can test and burn-in both logic and memory devices and includes
resources for high pin-count devices and configurations for
high-power and low-power applications. ABTS systems can be
configured with up to 72 burn-in boards, up to 320 I/O channels,
32M of test vector memory per channel and up to 16 independent
device power supplies. The ABTS system can be configured with a
scalable cost-effective individual device temperature control
solution for up to 64 devices per burn-in board and up to 75 watts
per device or more. Individual temperature control enables
high-power devices with a broad range of power dissipation to be
burned-in simultaneously in a single burn-in chamber while
maintaining a precise device temperature. The ABTS system also uses
N+1 redundancy technology for many key components in the system to
maximize system uptime.
About Aehr Test
SystemsHeadquartered in Fremont, California, Aehr Test
Systems is a worldwide provider of test systems for burning-in and
testing logic, optical and memory integrated circuits and has an
installed base of more than 2,500 systems worldwide. Increased
quality and reliability needs of the Automotive and Mobility
integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTS and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, and FOX DiePak® Carrier. The ABTS
system is used in production and qualification testing of packaged
parts for lower power and higher power logic devices as well as all
common types of memory devices. The FOX-XP system is a full wafer
contact and singulated die/module test and burn-in system used for
burn-in and functional test of complex devices, such as
leading-edge memories, digital signal processors, microprocessors,
microcontrollers, systems-on-a-chip, and integrated optical
devices. The WaferPak Contactor contains a unique full wafer
probe card capable of testing wafers up to 300mm that enables IC
manufacturers to perform test and burn-in of full wafers on Aehr
Test FOX systems. The DiePak Carrier is a reusable, temporary
package that enables IC manufacturers to perform cost-effective
final test and burn-in of both bare die and modules. For more
information, please visit Aehr Test System’s website at
www.aehr.com.
Safe Harbor StatementThis press
release contains certain forward-looking statements based on
current expectations, forecasts and assumptions that involve risks
and uncertainties. These statements are based on information
available to Aehr Test as of the date hereof and actual results
could differ materially from those stated or implied due to risks
and uncertainties. Forward-looking statements include statements
regarding expected shipping dates of our ABTS systems and uses of
our ABTS systems. The risks and uncertainties that could cause our
results to differ materially from those expressed or implied by
such forward-looking statements include, without limitation,
general world economic conditions and events, the state of the
semiconductor equipment market, our ability to maintain sufficient
cash to support operations, acceptance by customers of the ABTS
technology, acceptance by customers of the ABTS systems shipped
upon receipt of a purchase order and the ability of new products to
meet customer needs or perform as described. See Aehr Test’s recent
10-K and other reports from time to time filed with the Securities
and Exchange Commission for a more detailed description of the
risks facing our business. Aehr Test disclaims any obligation to
update information contained in any forward-looking statement to
reflect events or circumstances occurring after the date of this
press release.
Contacts:
Aehr Test Systems
Carl Buck
V.P. of Marketing
(510) 623-9400 x381
cbuck@aehr.com
MKR Group Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
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