Powerful AFM Offline Analysis Software Now Available for Oxford Instruments Asylum Research Jupiter XR Large-Sample Atomic Force Microscope
May 14 2024 - 12:00PM
Business Wire
Oxford Instruments Asylum Research today announces the release
of AR Maps, a new and powerful data analysis software package for
the Jupiter XR atomic force microscope (AFM). AR Maps provides
roughness information based on ISO standards, generates statistics
reports, conducts critical dimension and trench analysis, performs
particle analysis, and much more. The new AR Maps software package
will ship with all new Jupiter XR AFM systems and will be available
as an upgrade for existing customers.
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the full release here:
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“The Jupiter XR has become the go-to research AFM for industrial
applications with its x5-x20 faster scanning capability vs
traditional AFMs, high-resolution imaging performance that improves
accuracy and precision, and our exclusive blueDrive tapping mode
technology that enhances measurement stability and repeatability,”
said Dr. Ben Ohler, Senior Product Line Manager at Oxford
Instruments Asylum Research. “Asylum Research is committed to
strengthen efficiency on the Jupiter AFM, so in addition to the
Advanced Automation software package introduced a few months ago,
we are now offering AR Maps to provide robust offline analysis
capabilities.
Capabilities of AR Maps will be shown at an Asylum Research
webinar “Best Practices for Critical Dimension Measurements using
AFM: Probe Selection and Data Analysis” scheduled for May 15th at
8am and 6pm PDT. To register for this event, please go to
https://afm.oxinst.com/webinars/.
For more information see https://afm.oxinst.com/AR-Maps
About Oxford Instruments Asylum Research
Oxford Instruments Asylum Research is the technology leader in
atomic force microscopy for both materials and bioscience research.
Asylum Research AFMs are widely used by both academic and
industrial researchers for characterizing samples from diverse
fields spanning material science, polymers, thin films, energy
research, and biophysics. In addition to routine imaging of sample
topography and roughness, Asylum Research AFMs also offer unmatched
resolution and quantitative measurement capability for
nanoelectrical, nanomechanical, and electromechanical
characterization. Recent advances have made these measurements far
simpler and more automated for increased consistency and
productivity. Its Cypher, MFP-3D, Jupiter, and Vero AFM product
lines span a wide range of performance, versatility, and
budgets.
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For further information please contact David Beck Oxford
Instruments Asylum Research Inc. E: David.beck@oxinst.com | T:
+1-805-696-6466
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