Aehr Test Systems to Participate in the D.A. Davidson Semicap, Laser and Optical Conference on December 15
December 09 2020 - 7:30AM
Aehr Test Systems (
NASDAQ: AEHR),
a worldwide supplier of semiconductor test and reliability
qualification equipment, today announced it will participate in the
D. A. Davidson Semicap, Laser and Optical Conference being held
virtually on Tuesday, December 15, 2020 with a one-on-one meeting
format. Aehr Test President and CEO Gayn Erickson and CFO Ken Spink
will be available for meetings with investors throughout the day.
Mr. Erickson commented, “Aehr is uniquely positioned to enable
suppliers of both silicon photonics and traditional photonics
devices to perform full wafer scale manufacturing test and burn-in
of their devices to ensure they meet the initial quality and
long-term reliability requirements of the data center, network and
5G infrastructure markets. While the buzz about 5G focuses on
wireless and radio technology, photonics and fiber optics play
vital roles in transporting signals to and from the new 5G base
stations and the data centers that will require a major expansion
of transmission capacity as a result of 5G. Aehr Test has
introduced a new line of turnkey solutions that have been qualified
and are now in volume production at many of the world’s leading
suppliers of silicon photonic fiber optic transceivers. We are very
optimistic about the silicon photonics market as a significant
growth opportunity driver for Aehr and look forward to discussing
our semiconductor wafer level and singulated die test and burn-in
solutions and the markets they serve with investors.”
Tom Diffely, Senior Research Analyst of D.A. Davidson &
Co., commented, "Of the roughly 30 exciting companies attending
this year’s conference and serving the high growth semicap, laser
and optical markets, little known and under followed AEHR is
perhaps best positioned for explosive growth in the years
ahead. It’s new family of testers has just begun to penetrate
the emerging photonics, optical sensor, SiC power chip, and memory
markets that are poised to dramatically enhance the company’s
fortunes."
For additional information, or to schedule a virtual meeting
with Aehr management, please contact your D. A. Davidson
representative, or Aehr’s investor relations firm, MKR Investor
Relations, at aehr@mkr-group.com.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has installed over 2,500 systems worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Contacts: |
|
|
|
Aehr Test Systems |
MKR Investor Relations Inc. |
Ken Spink |
Todd Kehrli or Jim Byers |
Chief Financial Officer |
Analyst/Investor Contact |
(510) 623-9400 x309 |
(323) 468-2300 |
|
aehr@mkr-group.com |
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