Aehr Test Systems to Announce First Quarter Fiscal 2017 Financial Results on September 29, 2016
September 21 2016 - 9:00AM
Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of
semiconductor test and burn-in equipment, today announced that it
will report financial results for its first quarter of fiscal 2017
ended August 31, 2016 on Thursday, September 29, 2016 following the
close of the market. The Company will host a conference call and
webcast at 5:00 p.m. Eastern time to discuss the results.
What:
|
Aehr Test Systems first
quarter fiscal 2017 financial results conference call |
When: |
Thursday, September
29th at 5:00 p.m. Eastern Time (2:00 p.m. PT) |
Dial in
Number: |
To access the live
call, dial 888-708-5690 (US and Canada) or
913-312-0982 (International) and give the
participant passcode 6896012. |
Webcast: |
To access the live
webcast, please visit the investor relations section at
www.aehr.com. |
Call Replay: |
A phone replay of the call will be available
approximately two hours following the end of the call through 8:00
p.m. ET on Thursday, October 6, 2016. To access the replay dial-in
information, please click here. |
|
|
About Aehr Test
SystemsHeadquartered in Fremont, California, Aehr Test
Systems is a worldwide provider of test systems for burning-in and
testing logic and memory integrated circuits and has an installed
base of more than 2,500 systems worldwide. Increased quality and
reliability needs of the Automotive and Mobility integrated circuit
markets are driving additional test requirements, capacity needs
and opportunities for Aehr Test products in package and wafer level
test. Aehr Test has developed and introduced several innovative
products, including the ABTSTM and FOXTM families of test and
burn-in systems and WaferPak contactors. The ABTS systems are used
in production and qualification testing of packaged parts for both
low-power and high-power logic as well as memory devices. The FOX
family of systems includes single and multi-wafer full wafer
contact test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers and
systems-on-a-chip. The WaferPak contactor contains a unique full
wafer probe card capable of testing wafers up to 300mm that enables
IC manufacturers to perform test and burn-in of full wafers on Aehr
Test FOX systems. For more information, please visit Aehr Test’s
website at www.aehr.com.
Contacts:
Aehr Test Systems
Ken Spink
Chief Financial Officer
(510) 623-9400 x309
Investor Relations Contact:
Todd Kehrli or Jim Byers
MKR Group, Inc.
(323) 468-2300
aehr@mkr-group.com
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