Aehr Receives Follow-on Order for FOX-XP™ Wafer Level Test and Burn-in System for High Volume Production of Silicon Photoni...
April 04 2019 - 4:06PM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced that it has received a $2.1 million follow-on order from
one of its lead FOX-XP Test and Burn-in System customers for a
FOX-XP System to provide additional test capacity for the
customer’s increasing silicon photonics device production
requirements. The FOX-XP System is expected to ship within the next
six months.
The FOX-XP system is configurable with up to eighteen FOX-P
independent testers respectively each with their own independent
test system, test interface, and conductive thermal chuck. The
FOX-XP test and burn-in systems enable full wafer contact of
eighteen wafers in parallel at 90% smaller footprint than
traditional semiconductor test systems that can test a maximum of
only one wafer at a time.
Gayn Erickson, President and CEO of Aehr Test Systems,
commented, “We are excited to receive this follow-on order for an
additional FOX-XP system and to continue to work closely with this
customer, one of the world’s largest semiconductor manufacturers,
to support their production ramp in wafer-level burn-in capacity.
This customer is forecasting significant growth in shipments for
silicon photonics devices that we expect to drive the need for
additional production test and burn-in capacity for multiple years
into the future.
“We continue to be very optimistic about the silicon photonics
and photonics sensors markets and believe they will be significant
growth drivers for Aehr. Market Research Engine projects silicon
photonics for data center and high-performance computing to grow at
a compounded rate of 26.8% from 2017 through 2024. The rapid growth
of integrated optical devices in mobile devices, high-performance
servers and data centers, automotive applications, and now wearable
biosensor markets, is driving substantially higher requirements for
initial quality and long-term reliability, and they are increasing
with every new product generation. We believe these new
applications are driving an entirely new level of quality and
reliability expectation for these systems and pose a significant
long-term growth opportunity for Aehr.”
Aehr’s FOX-P systems are the company’s next-generation
multi-wafer and singulated die/module test solution that are
capable of functional test and burn-in/cycling of photonics
devices, flash memories, microcontrollers, sensors, and other
leading-edge ICs in wafer, bare die and module form before they are
assembled into single or multi-die stacked packages. The FOX
wafer-level systems utilize Aehr’s FOX WaferPak Contactors, which
provide cost effective solutions for making electrical contact with
a full wafer or substrate in a multi-wafer environment. The new
configuration with the DiePak® Carriers also enables burn-in of
singulated die and multi-die modules to screen for defects in both
the die and the module assembly process. The resulting known-good
die or single-die or stacked-die packaged parts can then be used
for high reliability and quality applications such as enterprise
solid state drives, automotive devices, highly valuable mobile
applications, and mission critical integrated circuits and
sensors.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has over 2,500 systems installed worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Safe Harbor Statement This press release
contains certain forward-looking statements based on current
expectations, forecasts and assumptions that involve risks and
uncertainties. These statements are based on information available
to Aehr as of the date hereof and actual results could differ
materially from those stated or implied due to risks and
uncertainties. Forward-looking statements include statements
regarding Aehr’s expectations, beliefs, intentions or strategies
regarding its products, including statements regarding future
market opportunities and conditions, expected product shipment
dates and customer orders or commitments. These risks and
uncertainties include, without limitation, customer demand and
acceptance of Aehr’s products, the ability of new products to meet
customer needs or perform as described, as well as general market
conditions and Aehr’s ability to execute on its business strategy.
See Aehr’s recent 10-K, 10-Q and other reports from time to time
filed with the Securities and Exchange Commission for a more
detailed description of the risks facing Aehr’s business. Aehr
disclaims any obligation to update information contained in any
forward-looking statement to reflect events or circumstances
occurring after the date of this press release.
Contacts:
Aehr Test SystemsVernon RogersEVP Sales and
Marketing(510) 623-9400 x215vrogers@aehr.com |
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MKR
Group Inc.Todd Kehrli or Jim ByersAnalyst/Investor Contact
(323) 468-2300aehr@mkr-group.com |
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