Aehr Test Systems to Present at the Craig-Hallum Alpha Select Conference in New York on November 16, 2016
November 04 2016 - 7:30AM
Aehr Test Systems (NASDAQ:AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced that Gayn Erickson, President and CEO, and Ken Spink,
CFO, will present at the Craig-Hallum Seventh Annual Alpha Select
Conference on Wednesday, November 16, 2016 at 3:30 p.m. Eastern
Time. The conference is being held at the Sheraton New York Times
Square Hotel in New York City.
To arrange a one-on-one meeting with Aehr Test management,
please contact either your Craig-Hallum sales person, or the MKR
Group, Aehr Test’s investor relations firm, at
aehr@mkr-group.com.
A live audio webcast will be available on the Investor Relations
section of Aehr Test’s website at www.aehr.com. A replay of the
webcast will be made available for 90 days following the event.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic and memory integrated
circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, capacity needs and opportunities for
Aehr Test products in package and wafer level test. Aehr Test has
developed and introduced several innovative products, including the
ABTSTM and FOXTM families of test and burn-in systems and WaferPak
contactors. The ABTS systems are used in production and
qualification testing of packaged parts for both low-power and
high-power logic as well as memory devices. The FOX family of
systems includes single and multi-wafer full wafer contact test and
burn-in systems used for burn-in and functional test of complex
devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The
WaferPak contactor contains a unique full wafer probe card capable
of testing wafers up to 300mm that enables IC manufacturers to
perform test and burn-in of full wafers on Aehr Test FOX systems.
For more information, please visit Aehr Test’s website at
www.aehr.com.
Contacts:
Aehr Test Systems
Ken Spink
Chief Financial Officer
(510) 623-9400 x309
MKR Group Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
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