Aehr Receives Order for Multiple FOX-NP™ Wafer Level Test and Burn-in Systems for Test and Qualification of Silicon Photoni...
February 20 2019 - 7:30AM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced that it has received a $2.4 million order from a leading
semiconductor manufacturer for Aehr’s new FOX-NP Test and Burn-in
Systems. The FOX-NP systems compliment the customer’s
existing fleet of FOX-XPTM Test and Burn-in Systems to provide
additional test and qualification capacity as a result of
increasing variety of silicon photonics devices. The FOX-NP Systems
are expected to ship within the next six months.
The FOX-NP system is a new configuration within the FOX-PTM
product family and is a low-cost entry-level system that is 100%
compatible with the FOX-XP system. The FOX-NP and the FOX-XP
systems are configurable with up to two or eighteen FOX-P
independent testers respectively each with their own independent
test system, test interface, and conductive thermal chuck.
The FOX-NP and FOX-XP test and burn-in systems enable full wafer
contact of two to eighteen wafers in parallel at 50% to 90% smaller
footprint than traditional semiconductor test systems that can test
a maximum of only one wafer at a time.
Gayn Erickson, President and CEO of Aehr Test Systems,
commented, “This customer is one of the world’s largest
semiconductor manufacturers, and we are excited to receive this
order for multiple FOX-NP systems and to see their continuing
ramp-up in wafer-level burn-in capacity. The FOX-NP system provides
a configuration and price point for companies to do initial
production qualification and New Product Introduction, or NPI,
which allows an easier transition to our high-volume FOX-XP system
for new customers. In the case of this lead customer, having
multiple FOX-NP systems enables them to run many wafers at several
different temperatures in parallel at completely different process
variations and burn-in conditions as part of their qualification
process. Each FOX-NP system has its own thermal control system to
allow independent temperatures and control of its FOX-P independent
testers. This customer is forecasting significant growth in
shipments for silicon photonics devices that we expect to drive the
need for additional production burn-in capacity for multiple years
into the future.
“We continue to be very optimistic about the silicon photonics
and photonics sensors markets and believe they will be significant
growth drivers for Aehr. Market Research Engine projects silicon
photonics for data center and high-performance computing to grow at
a compounded rate of 26.8% from 2017 through 2024. The rapid growth
of integrated optical devices in mobile devices, high-performance
servers and data centers, automotive applications, and now wearable
biosensor markets, is driving substantially higher requirements for
initial quality and long-term reliability, and they are increasing
with every new product generation. We believe these new
applications are driving an entirely new level of quality and
reliability expectation for these systems and pose a significant
long-term growth opportunity for Aehr.”
Aehr’s FOX-P systems are the company’s next-generation
multi-wafer and singulated die/module test solution that are
capable of functional test and burn-in/cycling of photonics
devices, flash memories, microcontrollers, sensors, and other
leading-edge ICs in wafer, bare die and module form before they are
assembled into single or multi-die stacked packages. The FOX
wafer-level systems utilize Aehr’s FOX WaferPak Contactors, which
provide cost effective solutions for making electrical contact with
a full wafer or substrate in a multi-wafer environment. The new
configuration with the DiePak® Carriers also enables burn-in of
singulated die and multi-die modules to screen for defects in both
the die and the module assembly process. The resulting known-good
die or single-die or stacked-die packaged parts can then be used
for high reliability and quality applications such as enterprise
solid state drives, automotive devices, highly valuable mobile
applications, and mission critical integrated circuits and
sensors.
About Aehr Test Systems Headquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has over 2,500 systems installed worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr products in package, wafer level, and singulated die/module
level test. Aehr has developed and introduced several innovative
products, including the ABTS™ and FOX-P™ families of test and
burn-in systems and FOX WaferPak™ Aligner, FOX-XP WaferPak
Contactor, FOX DiePak® Carrier and FOX DiePak Loader. The ABTS
system is used in production and qualification testing of packaged
parts for both lower power and higher power logic devices as well
as all common types of memory devices. The FOX-XP system is a full
wafer contact and singulated die/module test and burn-in system
used for burn-in and functional test of complex devices, such as
leading-edge memories, digital signal processors, microprocessors,
microcontrollers, systems-on-a-chip, and integrated optical
devices. The WaferPak contactor contains a unique full wafer probe
card capable of testing wafers up to 300mm that enables IC
manufacturers to perform test and burn-in of full wafers on Aehr
FOX systems. The DiePak Carrier is a reusable, temporary package
that enables IC manufacturers to perform cost-effective final test
and burn-in of both bare die and modules. For more information,
please visit Aehr’s website at www.aehr.com.
Safe Harbor Statement This press release
contains certain forward-looking statements based on current
expectations, forecasts and assumptions that involve risks and
uncertainties. These statements are based on information available
to Aehr as of the date hereof and actual results could differ
materially from those stated or implied due to risks and
uncertainties. Forward-looking statements include statements
regarding Aehr’s expectations, beliefs, intentions or strategies
regarding its products, including statements regarding future
market opportunities and conditions, expected product shipment
dates and customer orders or commitments. These risks and
uncertainties include, without limitation, customer demand and
acceptance of Aehr’s products, the ability of new products to meet
customer needs or perform as described, as well as general market
conditions and Aehr’s ability to execute on its business strategy.
See Aehr’s recent 10-K, 10-Q and other reports from time to time
filed with the Securities and Exchange Commission for a more
detailed description of the risks facing Aehr’s business. Aehr
disclaims any obligation to update information contained in any
forward-looking statement to reflect events or circumstances
occurring after the date of this press release.
Contacts: |
|
|
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Aehr Test Systems |
MKR Group Inc. |
Carl Buck |
Todd Kehrli or Jim Byers |
V.P of Marketing |
Analyst/Investor Contact |
(510) 623-9400 x381 |
(323) 468-2300 |
cbuck@aehr.com |
aehr@mkr-group.com |
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