Volume | 1,065,821 |
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News | (1) | ||||||
Day High | 677.72 | Low High |
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Day Low | 650.01 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
656.98 | 650.01 | 677.72 | 672.95 | 656.54 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
38,814 | 1,065,821 | $ 665.94 | $ 709,767,913 | - | 355.88 - 729.15 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
19:56:25 | 19 | $ 687.00 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
91.01B | 135.23M | - | 10.5B | 3.39B | 25.05 | 26.87 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 655.79 | 677.72 | 623.17 | 641.23 | 896,198 | 31.71 | 4.84% |
1 Month | 696.87 | 718.18 | 623.17 | 675.03 | 866,508 | -9.37 | -1.34% |
3 Months | 598.78 | 729.15 | 593.01 | 672.76 | 922,569 | 88.72 | 14.82% |
6 Months | 464.01 | 729.15 | 452.01 | 606.66 | 951,413 | 223.49 | 48.16% |
1 Year | 370.19 | 729.15 | 355.88 | 531.43 | 975,145 | 317.31 | 85.72% |
3 Years | 334.01 | 729.15 | 250.20 | 401.29 | 1,210,246 | 353.49 | 105.83% |
5 Years | 127.12 | 729.15 | 101.34 | 307.53 | 1,276,707 | 560.38 | 440.83% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |