Volume | 410,957 |
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News | (1) | ||||||
Day High | 717.60 | Low High |
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Day Low | 706.025 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
709.92 | 706.025 | 717.60 | 714.38 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
24,337 | 410,957 | $ 710.63 | $ 292,038,085 | - | 374.49 - 729.15 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
15:58:06 | 50 | $ 716.995 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
96.99B | 135.23M | - | 10.5B | 3.39B | 25.05 | 28.63 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 680.47 | 723.375 | 662.50 | 693.03 | 884,894 | 36.51 | 5.37% |
1 Month | 690.00 | 723.375 | 623.17 | 677.54 | 909,709 | 26.98 | 3.91% |
3 Months | 650.00 | 729.15 | 623.17 | 684.72 | 910,779 | 66.98 | 10.30% |
6 Months | 505.42 | 729.15 | 504.6601 | 624.88 | 943,592 | 211.56 | 41.86% |
1 Year | 386.29 | 729.15 | 374.49 | 543.49 | 969,510 | 330.69 | 85.61% |
3 Years | 309.61 | 729.15 | 250.20 | 405.21 | 1,207,424 | 407.37 | 131.58% |
5 Years | 116.25 | 729.15 | 101.34 | 311.17 | 1,272,310 | 600.73 | 516.76% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |