Volume | 585,875 |
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News | - | ||||||
Day High | 758.57 | Low High |
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Day Low | 739.65 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
758.41 | 739.65 | 758.57 | 747.68 | 749.48 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
19,769 | 585,875 | $ 751.09 | $ 440,042,774 | - | 404.80 - 763.93 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
19:56:55 | 1 | $ 747.85 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
101.11B | 135.23M | - | 10.5B | 3.39B | 25.05 | 29.85 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 720.00 | 763.93 | 705.18 | 737.39 | 697,553 | 27.68 | 3.84% |
1 Month | 646.40 | 763.93 | 623.17 | 693.65 | 861,556 | 101.28 | 15.67% |
3 Months | 683.00 | 763.93 | 623.17 | 692.30 | 877,986 | 64.68 | 9.47% |
6 Months | 531.77 | 763.93 | 527.11 | 635.70 | 926,992 | 215.91 | 40.60% |
1 Year | 411.34 | 763.93 | 404.80 | 550.72 | 964,657 | 336.34 | 81.77% |
3 Years | 298.45 | 763.93 | 250.20 | 408.00 | 1,199,617 | 449.23 | 150.52% |
5 Years | 107.72 | 763.93 | 101.34 | 314.71 | 1,264,322 | 639.96 | 594.10% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |