Verigy Introduces SmartRA Redundancy Analysis Option for its V6000 WS Memory Test System
June 30 2009 - 4:05PM
Business Wire
Verigy (NASDAQ:VRGY), a premier semiconductor test company,
today introduced SmartRA (Scalable Memory Redundancy Technology), a
memory redundancy analysis (RA) option for its V6000 WS test
system. SmartRA provides a scalable, flexible, cost-effective
solution that allows manufacturers to meet the expanding fail
storage and performance requirements of redundancy analysis for
DRAM. SmartRA will be showcased at the SEMICON West trade show in
Verigy�s Booth #921, South Hall, July 14 to 16, 2009 at the Moscone
Convention Center in San Francisco.
Verigy�s V6000 WS, introduced in November 2008, is the
industry�s first scalable, high-volume wafer sort test system for
both Flash and DRAM applications. With SmartRA, V6000 WS users can
easily add redundancy analysis capabilities for increased
throughput and yield.
As DRAM device densities continue to increase, so do the
challenges of today's wafer sort testing, requiring greater test
parallelism, higher test frequencies and increased levels of
complexity in device redundancy. These factors result in
unprecedented volumes of data during redundancy analysis.
Consequently, the storage and performance required to capture fail
data and effectively complete redundancy analysis are also reaching
new levels.
Verigy designed SmartRA to meet these requirements and because
the solution utilizes high-performance blade servers, manufacturers
can add processing power for redundancy analysis as they need it,
without impacting the test cell footprint. SmartRA is based on an
open software architecture which makes it possible for customers to
use Verigy-provided algorithms or develop their own for faster time
to market and lower cost-of-test.
�Unlike other testers that include the RA processing in the
tester architecture, the V6000 with SmartRA doesn�t require users
to spend more on replacing hardware to maintain throughput and
yield,� said Gayn Erickson, Vice President, Memory Test, Verigy.
�SmartRA�s unique architecture and industry-leading throughput
allow DRAM manufacturers to optimize their yield with scalable
upgrades to provide the right performance at the lowest cost.�
Hidden RA with SmartRA
SmartRA addresses the challenges of complex RA processes,
including decreased throughput due to exposed RA time and decreased
yields because of RA timeouts. The V6000 with SmartRA allows for
increased throughput and yields by hiding RA time and eliminating
pauses between patterns with changing test requirements.
About V6000
Verigy�s V6000 family of testers addresses the entire
semiconductor memory test process, including engineering, wafer
sort and final test. The V6000 can test either Flash or DRAM memory
by simply changing to a new test program and probe card, allowing
manufacturers unprecedented flexibility to shift production volumes
quickly and effortlessly between the memory types to meet market
conditions and maximize profits. Verigy�s V6000 testers include its
patent-pending Active Matrix� technology and sixth-generation
Tester-Per-Site� architecture, which combine to deliver the
industry�s lowest cost-of-test. The Active Matrix technology
provides massive parallelism, with over 18,000 I/O pins and over
4,000 programmable power supplies, and industry-best signal
integrity due to a dramatically shortened signal path to pin
electronics. For more information visit
www.verigy.com/go/memory.
About Verigy
Verigy�provides advanced semiconductor test systems and
solutions�used by leading companies worldwide in design validation,
characterization, and high-volume manufacturing test. Verigy
offers�scalable platforms�for a wide range of system-on-chip
(SOC)�test solutions,�and memory test solutions�for flash,
DRAM�including high-speed memories,�as well as multi-chip packages
(MCP). Advanced analysis tools accelerate design debug and yield
ramp processes for Verigy�s customers. Additional information about
Verigy can be found at www.verigy.com.
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