/C O R R E C T I O N -- Nova Measuring Instruments Ltd./
March 23 2005 - 3:48PM
PR Newswire (US)
/C O R R E C T I O N -- Nova Measuring Instruments Ltd./ In the
news release, Nova Introduces the new NovaScan 3090, issued earlier
today by Nova Measuring Instruments Ltd. over PR Newswire, we are
advised by the company that the sub-headline should read "Nova
Measuring Instruments introduces the NovaScan 3090CD on Lam
Research Corporation 2300 Exelan(R) Etch System and the NovaScan
3090SA Standalone System" and the second sub-headline, "The System
is Part of the NovaScan 3090 Unified Metrology Series, Designed for
Real-Time Advanced Process Control for the 65nm Technology Nodes
and Beyond" is struck entirely from the release as originally
issued inadvertently. REHOVOTH, Israel, March 23
/PRNewswire-FirstCall/ -- Nova Measuring Instruments Ltd.
(NASDAQ:NVMI), the market leader in integrated measurement and
process control for the semiconductor industry, today launched a
new series of metrology systems, the NovaScan 3090 series, starting
with the introduction of the NovaScan 3090CD that is installed on
Lam Research Corporation's (NASDAQ:LRCX) 2300 Exelan Etch System.
The system forms an advanced metrology platform for Critical
Dimension (CD) control and profile measurements, and is designed so
that it can operate both as an integrated metrology and stand alone
platform for 200mm and 300mm systems, for 65nm IC manufacturing and
beyond. The NovaScan 3090CD is based on Nova's earlier field proven
technology platform, the NovaScan 3060CD system. NovaScan 3090CD is
integrated in the exact same configuration as the NovaScan 3060CD
system, thus offering customers an easy upgrade path. Equipped with
a single polarized channel, from Deep-UV to Near-IR, the NovaScan
3090CD supports the measurement of 2D structures and enables 3D
shape characterization. The system provides real- time measurement
of CD, trench depth, photoresist height, thickness and shape of
complex layer stacks. The reliable single channel system provides
the highest throughput of an integrated system in the market, while
maintaining the cleanliness and hermetic structure needed to
operate in different process conditions. The system demonstrates a
2X performance improvement in metrology capabilities over the
NovaScan 3060CD, with enhanced throughput capabilities, while
integration and physical layout remain unchanged. Bents Kidron,
Nova's Director of Marketing states: "The NovaScan 3090CD is the
best Integrated Metrology solution for today's emerging industry
requirements, providing optical CD measurements and supporting the
emerging trends of 3-Dimensional and 'in-the-array' measurements."
About Nova: Nova Measuring Instruments Ltd. develops, designs and
produces integrated process control systems in the semiconductor
manufacturing industry. Nova provides a broad range of integrated
process control solutions that link different semiconductor
processes and process equipment. The Company's website is
http://www.nova.co.il/ DATASOURCE: Nova Measuring Instruments, Ltd
CONTACT: Company Contact: Chai Toren, CFO, Nova Measuring
Instruments Ltd., Tel: +972-8-938-7505, E-mail: ,
http://www.nova.co.il/; Investor relations Contacts: Ehud
Helft/Kenny Green, Gelbart Kahana, Tel: +1-866-704-6710, E-mail: /
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