inTEST to Present at the 13th Annual Needham Growth Conference
December 20 2010 - 6:00AM
Marketwired
inTEST Corporation (NASDAQ: INTT), an independent designer,
manufacturer and marketer of semiconductor automatic test equipment
(ATE) interface solutions and temperature management products,
today announced that it is scheduled to present at the 13th Annual
Needham Growth Conference on Thursday, January 13, 2011 at the New
York Palace Hotel in New York City.
Robert E. Matthiessen, President and Chief Executive Officer,
and Hugh T. Regan, Jr., Treasurer and Chief Financial Officer, will
be hosting meetings with investors to discuss the Company's
financial performance, business trends and growth opportunities.
Presentation materials will be made available on the investor
relations section of the Company's website at www.intest.com.
About inTEST Corporation inTEST
Corporation is an independent designer, manufacturer and marketer
of ATE interface solutions and temperature management products,
which are used by semiconductor manufacturers to perform final
testing of integrated circuits (ICs) and wafers. The Company's
high-performance products are designed to enable semiconductor
manufacturers to improve the speed, reliability, efficiency and
profitability of IC test processes. Specific products include
positioner and docking hardware products, temperature management
systems and customized interface solutions. The Company has
established strong relationships with semiconductor manufacturers
globally, which it supports through a network of local offices. For
more information visit www.intest.com.
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CONTACTS: Hugh T. Regan, Jr. Treasurer and Chief
Financial Officer inTEST Corporation Tel: 856-505-8811 David
Pasquale Global IR Partners Email Contact Tel: 914-337-8801
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