REHOVOT, Israel, July 12, 2010 /PRNewswire-FirstCall/ -- Nova
Measuring Instruments Ltd. (NASDAQ: NVMI) provider of leading edge
stand-alone metrology and the market leader of integrated metrology
solutions to the semiconductor process control market, today
uncovered its next generation Integrated Metrology platform
targeted at advanced technology nodes of 22nm and below. The Nova
i500 went through rigorous testing and is now qualified on an
industry leading CMP (chemical-mechanical polishing) platform. The
company also reported it is already in the process of receiving
initial tool orders.
The Nova i500 sets a new benchmark in Optical CD Integrated
Metrology. In furtherance of Nova's strategy to have identical
fully matched integrated and stand-alone metrology tool
generations, the Nova i500 offers the same metrology as the
successful Nova T500 stand-alone platform, which was selected for
22nm design rule by a leading foundry. The Nova i500 provides
unprecedented throughput with optical CD Move Acquire Measure (MAM)
time of less than 1 second and optical CD performance that until
now was only available on the Nova T500 system. Its unmatched
reliability and long life consumables add to a lower cost of
ownership (CoO) than any available Integrated Metrology system.
Noam Shintel, Director of Corporate Marketing said: "As
semiconductor manufacturers continue to move to advanced technology
nodes, the need for complex Optical CD measurements using
integrated metrology increases. In Copper interconnect optical CD
is now becoming an enabler for control of interconnect resistivity
through control of metal line thickness. Nova achieved a market
leading position and set the Integrated Metrology standard with the
successful NovaScan 3090Next IM and now sets a new standard with
the Nova i500. I see the performance and the lower CoO of the Nova
i500 as enablers to not only maintain but also to grow our
Integrated Metrology market share."
Deploying the same metrology as the Nova T500 stand-alone system
the Nova i500 provides optical CD metrology performance that
answers the requirements of advanced technology nodes of 22nm and
below in both CMP and Etch. With less than 1 second MAM time on
measurement pad sizes as small as 25X25 microns, the throughput of
the Nova i500 enables 100% pre & post polishing optical CD
measurements. Having more than 4,500 hours Mean Time Between
Failures (MTBF) the Nova i500 features the highest reliability of
any Integrated Metrology system. Longer life lamps reduce
consumables consumption and reduce the frequency of scheduled
Preventive Maintenance (PM) thus further contributing to low CoO. A
modern SEMI E95 compatible user interface coupled with a touch
screen provides easy operation, independent of the host equipment's
user interface.
For more information on the Nova i500 visit:
http://www.nova.co.il.
About Nova: Nova Measuring Instruments Ltd. develops, produces
and markets advanced integrated and stand alone metrology solutions
for the semiconductor manufacturing industry. Nova is traded on the
NASDAQ & TASE under the symbol NVMI. The Company's website is
http://www.nova.co.il.
This press release contains forward-looking statements within
the meaning of safe harbor provisions of the Private Securities
Litigation Reform Act of 1995 relating to future events or our
future performance, such as statements regarding trends, demand for
our products, expected deliveries, transaction, expected revenues,
operating results, earnings and profitability. Forward-looking
statements involve known and unknown risks, uncertainties and other
factors that may cause our actual results, levels of activity,
performance or achievements to be materially different from any
future results, levels of activity, performance or achievements
expressed or implied in those forward looking statements. These
risks and other factors include but are not limited to: our
dependency on two process control product lines; the highly
cyclical nature of the markets we target; our inability to reduce
spending during a slowdown in the semiconductor industry; our
ability to respond effectively on a timely basis to rapid
technological changes; our dependency on OEM suppliers; risks
associated with our dependence on a single manufacturing facility;
our ability to expand our manufacturing capacity or marketing
efforts to support our future growth; our dependency on a small
number of large customers and small number of suppliers; risks
related to our intellectual property; changes in customer demands
for our products; new product offerings from our competitors;
changes in or an inability to execute our business strategy;
unanticipated manufacturing or supply problems; changes in tax
requirements; changes in customer demand for our products; risks
related to currency fluctuations and risks related to our
operations in Israel. We cannot
guarantee future results, levels of activity, performance or
achievements. The matters discussed in this press release also
involve risks and uncertainties summarized under the heading "Risk
Factors" in Nova's Annual Report on Form 20-F for the year ended
December 31, 2009 filed with the
Securities and Exchange Commission on March
26, 2010. These factors are updated from time to time
through the filing of reports and registration statements with the
Securities and Exchange Commission. Nova Measuring Instruments Ltd.
does not assume any obligation to update the forward-looking
information contained in this press release.
Company Contact: Investor Relations Contacts:
Dror David, Chief Financial Officer Ehud Helft / Kenny Green
Nova Measuring Instruments Ltd. GCCG Investor Relations
Tel: 972-8-938-7505 Tel: +1-646-201-9246
E-mail: info@nova.co.il E-mail: nova@ccgisrael.com
http://www.nova.co.il
SOURCE Nova Measuring Instruments Ltd