Aehr Receives $10.8 Million Order for Production Test and Burn-in of Silicon Carbide Power Semiconductors for Electric Vehicl...
July 19 2021 - 7:30AM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and reliability qualification
equipment, today announced it has received a $10.8 million single
purchase order from its lead silicon carbide test and burn-in
customer for multiple FOX-XP™ systems and full sets of
WaferPak™ Contactors to meet their increased production
capacity needs. This customer is a leading Fortune 500 supplier of
semiconductor devices with a significant customer base in the
automotive semiconductor market. These FOX systems and WaferPaks
are expected to ship within the next six months.
Gayn Erickson, President and CEO of Aehr Test Systems,
commented, “These follow-on orders for additional FOX-XP systems
and WaferPaks are the result of our working closely with this lead
customer to achieve their test requirements and validation of our
FOX-P platform and WaferPak full wafer contactors as their
production qualified solution. This customer continues to forecast
orders for multiple additional FOX systems and WaferPak Contactors
this fiscal year and a significant number of systems and WaferPaks
over the next several years due to electric vehicle semiconductor
test and burn-in demand.
“Each of these silicon carbide-focused FOX-XP systems is
configured to test eighteen silicon carbide wafers in parallel in
the footprint of a typical single wafer test solution, while
contacting and testing 100% of the devices in parallel on each
wafer. Our solution can not only test 100mm and 150mm diameter
silicon carbide wafers, but can test the future 200mm wafers
planned to be introduced over the next several years. Aehr provides
a unique fully integrated solution that includes the test systems,
full wafer WaferPak Contactors, and WaferPak Aligners.
“Silicon carbide power semiconductors have emerged as the
preferred technology for battery electric vehicle power conversion
in on-board and off-board electric vehicle battery chargers, and
the electric power conversion and control of the electric engines.
These devices reduce power loss by as much as > 75% over power
silicon alternatives like IGBT (Insulated-gate bipolar transistor)
devices, which has essentially changed the entire market dynamic.
The challenge with silicon carbide is that it is known to have high
infant mortality rates. However, with the reliability burn-in
and screening that Aehr is able to offer with our FOX product
solutions, these defects can be removed to provide extremely
reliable devices for these mission-critical applications.
“Aehr’s FOX-XP solution allows for one of the key reliability
screening tests to be completed on an entire wafer full of devices,
basically testing all of them at one time, while also testing and
monitoring every device for failures during the burn-in process to
provide critical information on those devices. This is an
enormously valuable capability, as it allows our customers to
screen devices that would otherwise fail after they are packaged
into multi-die modules where the yield impact is 10 times or even
100 times as costly. Our FOX-P family of products are very
cost-effective solutions for ensuring the critical quality and
reliability of devices in this market, where performance and
reliability can not only mean increased battery life, but also
whether you have to walk home from a vehicle whose power
semiconductor fails in the power train.
“The power semiconductor market for electric vehicles is
expected to triple between 2020 and 2026, growing at a nearly 26%
CAGR to $5.6 billion, according to Yole research. And a report
from Deloitte forecasts total electric vehicle sales will grow
at a CAGR of 29% from 2020 to 2025, before reaching
31.1 million by 2030 and securing approximately 32% of the
total market share for new car sales. These stats highlight
the tremendous opportunity Aehr Test has in front of it with its
wafer level test and burn-in solution for electric vehicle
semiconductors.”
The FOX-XP system, available with multiple WaferPak Contactors
(full wafer test) or multiple DiePakTM Carriers (singulated
die/module test) configurations, is capable of functional test and
burn-in/cycling of integrated devices such as silicon carbide power
devices, silicon photonics as well as other optical devices, 2D and
3D sensors, flash memories, Gallium Nitride (GaN), magnetic
sensors, microcontrollers, and other leading-edge ICs in either
wafer form factor, before they are assembled into single or
multi-die stacked packages, or in singulated die or module form
factor.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has installed over 2,500 systems worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Safe Harbor StatementThis press release
contains certain forward-looking statements within the meaning of
Section 27A of the Securities Act of 1933 and Section 21E of the
Securities Exchange Act of 1934. Forward-looking statements
generally relate to future events or Aehr’s future financial or
operating performance. In some cases, you can identify
forward-looking statements because they contain words such as
"may," "will," "should," "expects," "plans," "anticipates,” “going
to,” "could," "intends," "target," "projects," "contemplates,"
"believes," "estimates," "predicts," "potential," or "continue," or
the negative of these words or other similar terms or expressions
that concern Aehr’s expectations, strategy, priorities, plans, or
intentions. Forward-looking statements in this press release
include, but are not limited to, future requirements and orders of
Aehr’s new and existing customers; bookings forecasted for
proprietary WaferPakTM and DiePak consumables; and expectations
related to long-term demand for Aehr’s productions and the
attractiveness of key markets. The forward-looking statements
contained in this press release are also subject to other risks and
uncertainties, including those more fully described in Aehr’s Form
10-K for fiscal 2020, Form 10-Q for the first fiscal quarter of
fiscal 2021 and other reports filed from time to time with the
Securities and Exchange Commission. Aehr disclaims any obligation
to update information contained in any forward-looking statement to
reflect events or circumstances occurring after the date of this
press release.
Contacts:
Aehr Test Systems |
MKR Investor Relations Inc. |
Vernon
Rogers |
Todd Kehrli
or Jim Byers |
EVP of Sales
& Marketing |
Analyst/Investor Contact |
(510)
623-9400 x215 |
(323)
468-2300 |
vrogers@aehr.com |
aehr@mkr-group.com |
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