Aehr Test Systems Exhibiting at SEMICON Taiwan 2018
September 05 2018 - 7:41PM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced that it is showcasing its FOX-XP™ next generation
multi-wafer test and burn-in systems for high volume production and
early failure rate (EFR) test in booth K2032 at SEMICON Taiwan
2018, taking place September 5-7 at the TWTC Nangang Hall Taipei,
Taiwan.
Aehr Test President and CEO Gayn Erickson commented, “Aehr Test
is a unique supplier of both complete production solutions as well
as subsystems including chambers, electronics, and thermal control
that can be combined with applications-specific hardware designed
with or provided by the customer. Aehr partners with our customers
to develop solutions to meet their needs for a range of new
applications where new solutions are needed to test and burn-in
devices in their application environment. This includes
automotive vehicle control and sensor systems, sensors and security
devices in mobile smartphones and tablets, and an entire new need
for reliability and assurance of operation in wearable
biosensors.”
The solutions Aehr Test is featuring at its SEMICON Taiwan
exhibit booth include:
- The FOX-XP system, the company’s next-generation multi-wafer
and now singulated die/module test solution that is capable of
functional test and burn-in/cycling of flash memories,
microcontrollers, sensors, and other leading-edge ICs in wafer form
before they are assembled into single or multi-die stacked
packages. The FOX wafer-level systems utilize Aehr Test's FOX
WaferPak™ contactors, which provide cost effective solutions for
making electrical contact with a full wafer or substrate in a
multi-wafer environment. The new configuration with the DiePak®
Carriers also enables burn-in of singulated die and multi-die
modules to screen for defects in both the die and the module
assembly process. The resulting known-good die or single-die or
stacked-die packaged parts can then be used for high reliability
and quality applications such as enterprise solid state drives,
automotive devices, highly valuable mobile applications, and
mission critical integrated circuits and sensors.
- The ABTS™ family of packaged part burn-in and test systems,
which is based on a state-of-the-art hardware and software platform
that is designed to address not only today’s devices, but also
future devices for many years to come. This system can test and
burn-in high pin-count devices and there are also configurations
for both high-power and low-power applications.
The key features of the FOX-XP test cell that contribute to the
cost-effectiveness of the solution include the ability to provide
up to 2,048 “Universal Channels” per wafer or DiePak carrier, which
allows the system to test all the devices on the wafer or DiePak
carrier in parallel. The innovative “Universal Channel”
architecture allows any channel to be any function (I/O, Device
Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)).
This enhanced architecture now allows customers to perform per pin
parametric testing, more extensive digital pattern test with deeper
data stimulus / capture memory (32M per pin), and deeper scan
(768M) optimized for BIST/DFT testing.
A single FOX-XP test system may be configured with up to 18
slots of test resources enabling up to 18 wafers to be tested
simultaneously. It also includes Aehr’s proprietary WaferPak full
wafer contactor or DiePak carrier, which enable meeting the very
high pin count and small pad size and pad pitch requirements of
today’s devices, and Aehr’s high performance thermal chucks that
enable managing the temperature of the high power density of the
devices under test. The footprint of the 18-slot test system is
similar to the footprint of typical semiconductor Automatic Test
Equipment (ATE) that can only test one wafer at a time.
With the highest wafer throughput available in the ATE industry,
the flexibility of Aehr Test’s new “Universal Channel”
architecture, and the ability to perform both functional pattern
verification and parametric testing at full-wafer parallel test,
the FOX-XP system provides a highly differentiated solution from
competitive alternatives.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has over 2,500 systems installed worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTS™ and FOX-P™
families of test and burn-in systems and FOX WaferPak™ Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP system is a full wafer contact and singulated die/module
test and burn-in system used for burn-in and functional test of
complex devices, such as leading-edge memories, digital signal
processors, microprocessors, microcontrollers, systems-on-a-chip,
and integrated optical devices. The WaferPak contactor contains a
unique full wafer probe card capable of testing wafers up to 300mm
that enables IC manufacturers to perform test and burn-in of full
wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable,
temporary package that enables IC manufacturers to perform
cost-effective final test and burn-in of both bare die and modules.
For more information, please visit Aehr Test Systems’ website at
www.aehr.com.
Contacts:
Aehr Test
Systems Carl Buck V.P of Marketing (510)
623-9400 x381 cbuck@aehr.com
|
MKR Group
Inc.Todd Kehrli or Jim ByersAnalyst/Investor Contact (323)
468-2300aehr@mkr-group.com |
Aehr Test Systems (NASDAQ:AEHR)
Historical Stock Chart
From Mar 2024 to Apr 2024
Aehr Test Systems (NASDAQ:AEHR)
Historical Stock Chart
From Apr 2023 to Apr 2024