Volume | 189,238 |
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News | - | ||||||
Day High | 698.79 | Low High |
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Day Low | 690.01 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
696.87 | 690.01 | 698.79 | 696.87 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
8,858 | 189,238 | $ 694.94 | $ 131,509,966 | - | 355.88 - 729.15 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
12:40:56 | 100 | $ 693.30 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
93.96B | 135.23M | - | 10.5B | 3.39B | 25.05 | 27.74 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 716.89 | 727.64 | 681.91 | 700.32 | 700,926 | -23.59 | -3.29% |
1 Month | 682.44 | 729.15 | 668.70 | 698.51 | 949,527 | 10.86 | 1.59% |
3 Months | 545.50 | 729.15 | 542.41 | 643.33 | 991,382 | 147.80 | 27.09% |
6 Months | 444.69 | 729.15 | 443.71 | 578.43 | 954,728 | 248.61 | 55.91% |
1 Year | 372.23 | 729.15 | 355.88 | 510.05 | 981,473 | 321.07 | 86.26% |
3 Years | 317.73 | 729.15 | 250.20 | 394.86 | 1,219,083 | 375.57 | 118.20% |
5 Years | 118.56 | 729.15 | 101.34 | 301.57 | 1,280,992 | 574.74 | 484.77% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |