Volume | 1,071,368 |
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News | - | ||||||
Day High | 647.71 | Low High |
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Day Low | 623.17 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
646.40 | 623.17 | 647.71 | 628.16 | 644.22 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
36,310 | 1,071,368 | $ 637.68 | $ 683,191,157 | - | 355.88 - 729.15 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
16:49:08 | formt | 100 | $ 627.49 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
84.77B | 135.23M | - | 10.5B | 3.39B | 25.05 | 25.02 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 684.44 | 698.70 | 623.17 | 670.14 | 937,133 | -56.95 | -8.32% |
1 Month | 706.43 | 718.29 | 623.17 | 686.76 | 822,749 | -78.94 | -11.17% |
3 Months | 624.00 | 729.15 | 581.70 | 667.56 | 953,487 | 3.49 | 0.56% |
6 Months | 485.94 | 729.15 | 452.01 | 601.32 | 951,873 | 141.55 | 29.13% |
1 Year | 367.96 | 729.15 | 355.88 | 526.94 | 978,448 | 259.53 | 70.53% |
3 Years | 330.96 | 729.15 | 250.20 | 399.79 | 1,213,098 | 296.53 | 89.60% |
5 Years | 123.28 | 729.15 | 101.34 | 306.54 | 1,277,704 | 504.21 | 409.00% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |