FormFactor Qualifies Industry's First One-Touchdown 300-mm Wafer Probe Solution for DRAM Sort Test
November 10 2009 - 4:05PM
Marketwired
FormFactor, Inc. (NASDAQ: FORM) today announced a major milestone
for the semiconductor test industry -- production qualification of
the industry's first one-touchdown probe card for 300-mm DRAM wafer
sort testing. FormFactor achieved the milestone with its Harmony
eXP full-wafer contact probe card employing advanced TRE(TM)
technology to simultaneously test all die on the DRAM wafer. The
proprietary technology allows the multiplication of existing tester
resources; in this case to an industry-leading x11 parallelism
(simultaneously testing 11 devices per tester channel). The
advanced probe card also allows the testing of the entire wafer at
two temperatures, enabling sort testing at both hot and cold
extremes. This dual-temperature capability helps IC manufacturers
meet their reliability and performance requirements at the lowest
cost of test.
FormFactor shipped the first Harmony eXP one-touchdown sort card
to Elpida Memory, Inc. for testing of leading-edge DRAM devices.
Because FormFactor's proprietary TRE technology can amplify the
number of die simultaneously tested with existing tester resources,
device manufacturers can use FormFactor's Harmony eXP cards to
leverage their existing test equipment to increase total available
test capacity. In this way, not only does test cell throughput
increase significantly, but Harmony eXP also allows memory
manufacturers to reduce their need for capital investment.
"Our Harmony eXP probe card solution enables maximum throughput,
which is critical to help our customers reduce their
time-to-market," stated Stefan Zschiegner, senior vice president
and general manager of FormFactor's DRAM Product Business Group.
"FormFactor's long-standing commitment to R&D has allowed us to
intercept the goal of one touchdown testing. We continue to push
the limits of probe testing to ensure that both we and our
customers remain on the cutting-edge of the test technology
roadmap."
One-touchdown testing of the entire wafer is enabled by advanced
electronics and FormFactor's proprietary MEMS MicroSpring®
contactor, which is designed to withstand the rigors of production
testing and minimize cleaning -- further increasing probe card
availability and test cell productivity.
Forward-Looking Statements
Statements in this press release that are not strictly
historical in nature are forward-looking statements within the
meaning of the federal securities laws, including statements
regarding business momentum, demand for our products and solutions
and future growth. These forward-looking statements are based on
current information and expectations that are inherently subject to
change and involve a number of risks and uncertainties. Actual
events or results might differ materially from those in any
forward-looking statement due to various factors, including, but
not limited to: customer adoption of the company's Harmony
one-touchdown probe cards; the ability of the company's Harmony one
touchdown cards to operate at dual temperature, to minimize
necessary cleaning and increase probe card availability and test
cell productivity, to enable device manufacturers to leverage their
existing test equipment to increase total available test capacity,
to increase manufacturers test cell throughput and to provide
device manufacturers the flexibility to postpone new test equipment
purchases thereby reducing their need for capital investment; and
the ability of the company to remain on the cutting edge of test
technology roadmaps. Additional information concerning factors that
could cause actual events or results to differ materially from
those in any forward-looking statement is contained in the
company's Form 10-K for the fiscal year ended December 27, 2008 and
Form 10-Q for the fiscal quarter ended June 27, 2009 as filed with
the Securities and Exchange Commission ("SEC"), and subsequent SEC
filings. Copies of the company's SEC filings are available at
http://investors.formfactor.com/edgar.cfm. The company assumes no
obligation to update the information in this press release, to
revise any forward-looking statements or to update the reasons
actual results could differ materially from those anticipated in
forward-looking statements.
About FormFactor
Founded in 1993, FormFactor, Inc. (Nasdaq: FORM) is the leader
in advanced wafer probe cards, which are used by semiconductor
manufacturers to electrically test ICs. The company's wafer sort,
burn-in and device performance testing products move IC testing
upstream from post-packaging to the wafer level, enabling
semiconductor manufacturers to lower their overall production
costs, improve yields, and bring next-generation devices to market.
FormFactor is headquartered in Livermore, California with
operations in Europe, Asia and North America. For more information,
visit the company's web site at www.formfactor.com.
FormFactor, Harmony, Harmony eXP, TRE and MicroSpring are
trademarks or registered trademarks of FormFactor, Inc.
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Investor Contact: Michael Magaro Investor Relations (925)
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