Aehr Test Systems to Announce First Quarter Fiscal 2021 Financial Results on September 24, 2020
September 16 2020 - 7:30AM
Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of
semiconductor test and reliability qualification equipment, today
announced that it will report financial results for its first
quarter of fiscal 2021 ended August 31, 2020 on Thursday, September
24, 2020 following the close of the market. The Company will host a
conference call and webcast at 5:00 p.m. Eastern time to discuss
the results.
What: |
Aehr Test Systems first quarter fiscal 2021 financial results
conference call. |
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When: |
Thursday, September 24, at 5:00
p.m. Eastern Time (2:00 p.m. PT). |
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Dial in
Number: |
To access the live call, dial
800-353-6461 (US and Canada) or +1
334-323-0501 (International) and give the participant
passcode 9822939. |
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Webcast: |
To access the live webcast,
please visit the investor relations section at www.aehr.com. |
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Call
Replay: |
A phone replay of the call will
be available approximately two hours following the end of the call
through 8:00 p.m. ET on Thursday, October 1, 2020. To access the
replay dial-in information, please click here. |
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has installed over 2,500 systems worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Aehr Test Systems |
MKR Investor Relations Inc. |
Ken Spink |
Todd Kehrli or Jim Byers |
Chief Financial Officer |
Analyst/Investor Contact |
(510) 623-9400 x309 |
(323) 468-2300 |
|
aehr@mkr-group.com |
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