Aehr Test Systems announces changes to its Board of Directors
September 09 2020 - 7:30AM
Aehr Test Systems (NASDAQ: AEHR), a worldwide
supplier of semiconductor test and reliability qualification
equipment, today announced it has appointed Geoff Scott to its
board of directors, effective September 2, 2020. The Company
also announced John Schneider, who has served on the Aehr Test
Systems board since 2014, has resigned for personal reasons
effective September 2, 2020. The number of Aehr Test board
members remains at six.
"Geoff brings a background of both corporate finance and Board
level engagement. As an investor in emerging high growth companies,
his experience will be a valuable addition as we continue to focus
on the many expanding opportunities for the Company. I would
also like to take this opportunity to thank John for more than 5
years of service, support and belief in Aehr Test Systems including
participation in our common stock offerings," said Gayn Erickson,
president and CEO.
Mr. Scott came up through the corporate finance divisions of
both Chase Manhattan Bank, now JP Morgan Chase, and Merrill Lynch.
For the last 25 years, he has been President of Scott Asset
Management, whose clients invest primarily in small cap but
industry leading companies. He was a participant in two of Aehr
Test's private placements and continues to be a substantial
shareholder. He graduated from Dartmouth College with Degrees in
Political Science and Economics.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic, optical and memory
integrated circuits and has over 2,500 systems installed worldwide.
Increased quality and reliability needs of the Automotive and
Mobility integrated circuit markets are driving additional test
requirements, incremental capacity needs, and new opportunities for
Aehr Test products in package, wafer level, and singulated
die/module level test. Aehr Test has developed and introduced
several innovative products, including the ABTSTM and FOX-PTM
families of test and burn-in systems and FOX WaferPakTM Aligner,
FOX-XP WaferPak Contactor, FOX DiePak® Carrier and FOX DiePak
Loader. The ABTS system is used in production and qualification
testing of packaged parts for both lower power and higher power
logic devices as well as all common types of memory devices. The
FOX-XP and FOX-NP systems are full wafer contact and singulated
die/module test and burn-in systems used for burn-in and functional
test of complex devices, such as leading-edge memories, digital
signal processors, microprocessors, microcontrollers,
systems-on-a-chip, and integrated optical devices. The FOX-CP
system is a new low-cost single-wafer compact test and reliability
verification solution for logic, memory and photonic devices and
the newest addition to the FOX-P product family. The WaferPak
contactor contains a unique full wafer probe card capable of
testing wafers up to 300mm that enables IC manufacturers to perform
test and burn-in of full wafers on Aehr Test FOX systems. The
DiePak Carrier is a reusable, temporary package that enables IC
manufacturers to perform cost-effective final test and burn-in of
both bare die and modules. For more information, please visit Aehr
Test Systems’ website at www.aehr.com.
Contacts:
Aehr Test Systems |
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MKR Investor Relations Inc. |
Ken Spink |
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Todd Kehrli or Jim Byers |
Chief Financial Officer |
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Analyst/Investor Contact |
(510) 623-9400 x309 |
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(323) 468-2300 |
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aehr@mkr-group.com |
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