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Period:
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| Volume | 1,090 |
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| Company Name | Stock Ticker Symbol | Market | Type |
|---|---|---|---|
| KLA Corporation | KLAC | NASDAQ | Common Stock |
| Price Change | Change Percent | Stock Price | Last Traded
|
|
|---|---|---|---|---|
| 1.37 | 0.22% | 635.01 | 09:11:24 |
| Open Price | Low Price | High Price | Close Price | Prev Close |
|---|---|---|---|---|
| 633.64 |
| Trades | Volume | Avg Volume | 52 Week Range |
|---|---|---|---|
| 103 | 1,090 | - | 355.88 - 729.15 |
| Last Trade Time | Type | Quantity | Stock Price | Currency |
|---|---|---|---|---|
| 09:20:07 | 5 | $ 637.244 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
| Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
|---|---|---|---|---|---|---|
| 85.69B | 135.23M | - | 10.5B | 3.39B | 25.05 | 25.30 |
| Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
|---|---|---|---|---|---|
| - | - | - | - |
KLA News
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Historical KLAC Price Data
| Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
|---|---|---|---|---|---|---|---|
| 1 Week | 681.93 | 696.915 | 623.17 | 651.14 | 997,269 | -46.92 | -6.88% |
| 1 Month | 705.04 | 718.18 | 623.17 | 679.10 | 880,144 | -70.03 | -9.93% |
| 3 Months | 595.02 | 729.15 | 581.70 | 670.29 | 931,784 | 39.99 | 6.72% |
| 6 Months | 459.00 | 729.15 | 452.01 | 604.31 | 950,566 | 176.01 | 38.35% |
| 1 Year | 372.86 | 729.15 | 355.88 | 530.24 | 975,130 | 262.15 | 70.31% |
| 3 Years | 327.99 | 729.15 | 250.20 | 400.76 | 1,211,324 | 307.02 | 93.61% |
| 5 Years | 123.28 | 729.15 | 101.34 | 306.94 | 1,277,264 | 511.73 | 415.10% |
KLA Description
| KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |
