Volume | 798,103 |
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News | - | ||||||
Day High | 705.17 | Low High |
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Day Low | 689.27 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
696.33 | 689.27 | 705.17 | 690.70 | 683.90 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
25,077 | 798,103 | $ 697.00 | $ 556,280,289 | - | 355.88 - 729.15 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
19:59:47 | 25 | $ 688.80 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
93.41B | 135.23M | - | 10.5B | 3.39B | 25.05 | 27.58 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 690.00 | 705.17 | 675.11 | 688.83 | 1,121,590 | -3.00 | -0.43% |
1 Month | 654.51 | 729.15 | 639.1701 | 690.44 | 974,086 | 32.49 | 4.96% |
3 Months | 586.90 | 729.15 | 542.41 | 632.42 | 989,092 | 100.10 | 17.06% |
6 Months | 455.43 | 729.15 | 440.15 | 564.87 | 961,840 | 231.57 | 50.85% |
1 Year | 389.55 | 729.15 | 355.88 | 503.25 | 989,799 | 297.45 | 76.36% |
3 Years | 298.30 | 729.15 | 250.20 | 391.31 | 1,232,796 | 388.70 | 130.31% |
5 Years | 119.89 | 729.15 | 101.34 | 298.73 | 1,285,209 | 567.11 | 473.03% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |