Aehr Test Systems to Announce Second Quarter Fiscal 2017 Financial Results on January 5, 2017
December 22 2016 - 7:30AM
Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of
semiconductor test and burn-in equipment, today announced that it
will report financial results for its second quarter of fiscal 2017
ended November 30, 2016 on Thursday, January 5, 2017 following the
close of the market. The Company will host a conference call and
webcast at 5:00 p.m. Eastern time to discuss the results.
What: |
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Aehr Test Systems
second quarter fiscal 2017 financial results conference call |
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When: |
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Thursday, January 5th
at 5:00 p.m. Eastern Time (2:00 p.m. PT) |
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Dial in
Number: |
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To access the live
call, dial 888-239-5343 (US and Canada) or
913-312-1448 (International) and give the
participant passcode 7947996. |
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Webcast: |
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To access the live
webcast, please visit the investor relations section at
www.aehr.com. |
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Call
Replay: |
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A phone replay of the
call will be available approximately two hours following the end of
the call through 8:00 p.m. ET on Thursday, January 12, 2017. To
access the replay dial-in information, please click here. |
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic and memory integrated
circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, capacity needs and opportunities for
Aehr Test products in package and wafer level test. Aehr Test has
developed and introduced several innovative products, including the
ABTSTM and FOXTM families of test and burn-in systems and WaferPak
contactors. The ABTS systems are used in production and
qualification testing of packaged parts for both low-power and
high-power logic as well as memory devices. The FOX family of
systems includes single and multi-wafer full wafer contact test and
burn-in systems used for burn-in and functional test of complex
devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The
WaferPak contactor contains a unique full wafer probe card capable
of testing wafers up to 300mm that enables IC manufacturers to
perform test and burn-in of full wafers on Aehr Test FOX systems.
For more information, please visit Aehr Test’s website at
www.aehr.com.
Contacts:
Aehr Test Systems
Ken Spink
Chief Financial Officer
(510) 623-9400 x309
Investor Relations Contact:
Todd Kehrli or Jim Byers
MKR Group, Inc.
(323) 468-2300
aehr@mkr-group.com
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