Aehr Test Systems to Participate in the Fifth Annual Midtown CAP Investor Summit in New York
December 02 2016 - 7:30AM
Aehr Test Systems (NASDAQ:AEHR), a worldwide
supplier of semiconductor test and burn-in equipment, today
announced that Gayn Erickson, President and CEO, will participate
in the Fifth Annual Midtown CAP Investor Summit 2016 being held
December 8, 2016 at Le Parker Meridien Hotel in New York City.
Aehr Test will post its presentation materials used at the
conference on the Investor Relations section of the Company's
website at www.aehr.com.
“We look forward to discussing how our new FOX wafer level test
and burn-in products provide unique and highly valuable test and
burn-in solutions for our customers and are positioning Aehr Test
for future growth and success in the growing integrated circuit and
sensor reliability and test markets,” said Erickson. “These markets
include stacked flash memory for enterprise Solid State Drive
applications, automotive infotainment and advanced driving
assistance systems, and mobility applications for smartphones and
wearable devices. Our new products include unique single and
multi-wafer burn-in and test systems that offer low-cost, highly
parallel testing solutions to improve reliability and yield of our
customers’ products.”
The Midtown CAP Summit is hosted by executive management from
the following participating companies: Aehr Test Systems (AEHR),
Axcelis (ACLS), Advanced Energy Industries (AEIS), Brooks
Automation (BRKS), Camtek Ltd (CAMT), Cohu (COHU), Electro
Scientific Industries (ESIO), FormFactor (FORM), inTEST Corporation
(INTT), Intevac (IVAC), Kulicke & Soffa (KLIC), Nanometrics
(NANO), Rudolph Technologies (RTEC), Ultratech (UTEK),) and Xcerra
Corporation (XCRA), and will feature a “round-robin” format
consisting of a series of small group meetings.
The Midtown CAP Summit is by invitation only and is open to
accredited investors and publishing research analysts.
About Aehr Test SystemsHeadquartered in
Fremont, California, Aehr Test Systems is a worldwide provider of
test systems for burning-in and testing logic and memory integrated
circuits and has an installed base of more than 2,500 systems
worldwide. Increased quality and reliability needs of the
Automotive and Mobility integrated circuit markets are driving
additional test requirements, capacity needs and opportunities for
Aehr Test products in package and wafer level test. Aehr Test has
developed and introduced several innovative products, including the
ABTSTM and FOXTM families of test and burn-in systems and WaferPak
contactors. The ABTS systems are used in production and
qualification testing of packaged parts for both low-power and
high-power logic as well as memory devices. The FOX family of
systems includes single and multi-wafer full wafer contact test and
burn-in systems used for burn-in and functional test of complex
devices, such as leading-edge memories, digital signal processors,
microprocessors, microcontrollers and systems-on-a-chip. The
WaferPak contactor contains a unique full wafer probe card capable
of testing wafers up to 300mm that enables IC manufacturers to
perform test and burn-in of full wafers on Aehr Test FOX systems.
For more information, please visit Aehr Test’s website at
www.aehr.com.
Contacts:
Aehr Test Systems
Ken Spink
Chief Financial Officer
(510) 623-9400 x309
MKR Group Inc.
Todd Kehrli or Jim Byers
Analyst/Investor Contact
(323) 468-2300
aehr@mkr-group.com
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