Volume | 902,984 |
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News | - | ||||||
Day High | 658.4099 | Low High |
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Day Low | 642.00 |
Company Name | Stock Ticker Symbol | Market | Type |
---|---|---|---|
KLA Corporation | KLAC | NASDAQ | Common Stock |
Open Price | Low Price | High Price | Close Price | Prev Close |
---|---|---|---|---|
655.79 | 642.00 | 658.4099 | 644.22 | 658.98 |
Trades | Volume | VWAP | Dollar Volume | Avg Volume | 52 Week Range |
---|---|---|---|---|---|
39,550 | 902,984 | $ 650.23 | $ 587,144,180 | - | 355.88 - 729.15 |
Last Trade Time | Type | Quantity | Stock Price | Currency |
---|---|---|---|---|
19:31:37 | 5 | $ 642.00 | USD |
KLA (KLAC) Options Flow Summary
KLA Corporation Financials
Market Cap | Shares in Issue | Float | Revenue | Profit/Loss | EPS | PE Ratio |
---|---|---|---|---|---|---|
87.12B | 135.23M | - | 10.5B | 3.39B | 25.05 | 25.72 |
Short Interest | Dividends Per Share | Dividend Yield | Ex-Div Date | Insider B/S | Insider % Owned |
---|---|---|---|---|---|
- | - | - | - |
KLA News
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Historical KLAC Price Data
Period | Open | High | Low | VWAP | Avg. Daily Vol | Change | % |
---|---|---|---|---|---|---|---|
1 Week | 694.83 | 701.625 | 642.00 | 680.78 | 928,549 | -50.61 | -7.28% |
1 Month | 716.89 | 727.64 | 642.00 | 690.53 | 820,545 | -72.67 | -10.14% |
3 Months | 651.50 | 729.15 | 581.70 | 667.18 | 971,306 | -7.28 | -1.12% |
6 Months | 478.47 | 729.15 | 452.01 | 600.32 | 952,837 | 165.75 | 34.64% |
1 Year | 375.21 | 729.15 | 355.88 | 525.47 | 977,916 | 269.01 | 71.70% |
3 Years | 330.96 | 729.15 | 250.20 | 399.81 | 1,211,028 | 313.26 | 94.65% |
5 Years | 124.39 | 729.15 | 101.34 | 306.47 | 1,277,172 | 519.83 | 417.90% |
KLA Description
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. |